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  lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) 3-terminal 1a positive voltage regulators the lm78xx series of three-terminal positive regulators are available in the to-220/d-pak package and with several fixed output voltages, making them useful in a wide range of applications. each type employs internal current limiting, thermal shut-down and safe area protection, making it essentially indestructible. if adequate heat sinking is provided, they can deliver over 1a output current. although designed primarily as fixed voltage regulators, these devices can be used with external components to obtain adjustable voltages and currents. features output current up to 1a output voltages of 5, 6, 8, 9, 10, 11, 12, 15, 18, 24v thermal overload protection short circuit protection output transistor soa protection ka78xx ct 4% ka78xxa t 2% ka78xxi t to-220 -40 ~ +125 c ka78xx r ka78xxa r 2% ka78xxi r 4% d-pak -40 ~ +125 c 0 ~ +125 c 0 ~ +125 c to-220 d-pak 1: input 2: gnd 3: output block diagram 1 ordering information device operating temperature 4% output v oltage tolerance packag e ? 1999 fairchild semiconductor corporation rev. b
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) absolute maximum ratings (t a = +25 c, unless otherwise specified ) lm7805/i/r/ri electrical characteristics (refer to test circuit, t min < t j < t max , i o = 500ma, v i = 10v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7806/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7808/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7809/i/r/ri electrical characteristics (refer to test circuit. t min < t j lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm 7810/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7811/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7812/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7815/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7818/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7824/i/r/ri electrical characteristics (refer to test circuit, t min lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7805a/ra electrical characteristics (refer to the test circuits. t j = 0 to +i25 c, i o = 1a, v i = 10v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) *load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 4.9 5 5.1 output voltage v o i o = 5ma to 1a, p d 5w v i = 7.5 to 20v 4.8 5 5.2 v v i = 7.5 to 25v i o = 500ma 5 50  line regulation d v o v i = 8v to 12v 3 50 v v i = 7.3v to 25v 5 50 v i = 8v to 12v 1.5 25 t j =+25 c i o = 5ma to 1.5a 9 100 i o = 5ma to 1a 9 100 i o = 250 to 750ma 4 50 quiescent current i q t j =+25 c 5.0 6 ma i o = 5ma to 1a 0.5 quiescent current change d i q v i = 8 v to 25v, i o = 500ma 0.8 ma v i = 7.5v to 20v, t j =+25 c 0.8 output voltage drift -0.8 mv/ c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 8v to 18v 68 db dropout voltage v d i o = 1a, t j =+25 c 2 v output resistance r o f = 1khz 17 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j = +25 c 2.2 a  load regulation d v o t j =+25 c d v/ d t i o = 5ma m v/v o v
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7806a/ra electrical characteristics (refer to the test circuits. t j = 0 to+150 c, i o = 1a, v i = 11v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 5.58 6 6.12 output voltage v o i o = 5ma to 1a, p d 15w v i = 8.6 to 21v 5.76 6 6.24 v v i = 8.6 to 25v i o = 500ma 5 60  line regulation d v o v i = 9v to 13v 3 60 mv v i = 8.3v to 21v 5 60 v i = 9v to 13v 1.5 30 t j =+25 c i o = 5ma to 1.5a 9 100 i o = 5ma to 1a 4 100 i o = 250 to 750ma 5.0 50 quiescent current i q t j =+25 c 4.3 6 ma i o = 5ma to 1a 0.5 quiescent current change d i q v i = 9v to 25v, i o = 500ma 0.8 ma v i = 8.5v to 21v, t j =+25 c 0.8 output voltage drift i o = 5ma -0.8 mv/ c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 m v/v o ripple rejection rr f = 120hz, i o = 500ma v i = 9v to 19v 65 db dropout voltage v d i o = 1a, t j =+25 c 2 v output resistance r o f = 1khz 17 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c d v/ d t mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7808a/ra electrical characteristics (refer to the test circuits. t j = 0 to+150 c, i o = 1a, v i = 14v, c i = 0.33 m f, c o =0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 7.84 8 8.16 output voltage v o i o = 5ma to 1a, p d 15w v i = 8.6 to 21v 7.7 8 8.3 v v i = 10.6 to 25v i o = 500ma 6 80  line regulation d v o v i = 11to 17v 3 80 mv v i = 10.4v to 23v 6 80 v i = 11v to 17v 2 40 t j =+25 c i o = 5ma to 1.5a 12 100 i o = 5ma to 1a 12 100 i o = 250 to 750ma 5 50 quiescent current i q t j =+25 c 5.0 6 ma i o = 5ma to 1a 0.5 quiescent current change d i q v i = 11v to 25v, i o = 500ma 0.8 ma v i = 10.6v to 23v, t j =+25 c 0.8 output voltage drift i o = 5ma -0.8 mv / c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 m v/v o ripple rejection rr f = 120hz, i o = 500ma v i = 11.5v to 21.5v 62 db dropout voltage v d i o = 1a, t j =+25 c 2 v output resistance r o f = 1khz 18 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c d v/ d t mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7809a/ra electrical characteristics (refer to the test circuits. t j = 0 to +125 c, i o = 1a, v i = 15v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 8.82 9.0 9.18 output voltage v o i o = 5ma to 1a, p d 15w v i = 11.2 to 24v 8.65 9.0 9.35 v v i = 11.7 to 25v i o = 500ma 6 90  line regulation d v o v i = 12.5 to 19v 4 45 mv v i = 11.5v to 24v 6 90 v i = 12.5v to 19v 2 45 t j =+25 c i o = 5ma to 1.0a 12 100 i o = 5ma to 1.0a 12 100 i o = 250 to 750ma 5 50 quiescent current i q t j =+25 c 5.0 6.0 ma v i = 11.7v to 25v, t j =+25 c 0.8 quiescent current change d i q v i = 12v to 25v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.5 output voltage drift i o = 5ma -1.0 mv/ c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 12v to 22v 62 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 17 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c d v/ d t m v/v o mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7810a/ra electrical characteristics (refer to the test circuits. t j = 0 to+125 c, i o = 1a, v i = 16v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 9.8 10 10.2 output voltage v o i o = 5ma to 1a, p d 15w v i =12.8 to 25v 9.6 10 10.4 v v i = 12.8 to 26v i o = 500ma 8 100  line regulation d v o v i = 13to 20v 4 50 mv v i = 12.5v to 25v 8 100 v i = 13v to 20v 3 50 t j =+25 c i o = 5ma to 1.5a 12 100 i o = 5ma to 1.0a 12 100 i o = 250 to 750ma 5 50 quiescent current i q t j =+25 c 5.0 6.0 ma v i = 13v to 26v, t j =+25 c 0.5 quiescent current change d i q v i = 12.8v to 25v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.5 output voltage drift i o = 5ma -1.0 mv c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 14v to 24v 62 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 17 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c d v/ d t m v/v o mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7811a/ra electrical characteristics (refer to the test circuits. t j = 0 to +125 c, i o = 1a, v i = 18v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 10.8 11.0 11.2 output voltage v o i o = 5ma to 1a, p d 15w v i = 13.8 to 26v 10.6 11.0 11.4 v v i = 12.8 to 26v i o = 500ma 10 110  line regulation d v o v i = 15 to 21v 4 55 mv v i = 13.5v to 26v 10 110 v i = 15v to 21v 3 55 t j =+25 c i o = 5ma to 1.5a 12 100 i o = 5ma to 1.0a 12 100 i o = 250 to 750ma 5 50 quiescent current i q t j =+25 c 5.1 6.0 ma v i = 13.8v to 26v, t j =+25 c 0.8 quiescent current change d i q v i = 14v to 27v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.5 output voltage drift d v o / d t i o = 5ma -1.0 mv / c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 14v to 24v 61 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 18 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c m v/v o mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7812a/ra electrical characteristics (refer to the test circuits. t j = 0 to +125 c, i o = 1a, v i = 19v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 11.75 12 12.25 output voltage v o i o = 5ma to 1a, p d 15w v i = 14.8 to 27v 11.5 12 12.5 v v i = 14.8 to 30v i o = 500ma 10 120  line regulation d v o v i = 16 to 22v 4 120 mv v i = 14.5v to 27v 10 120 v i = 16v to 22v 3 60 t j =+25 c i o = 5ma to 1.5a 12 100 i o = 5ma to 1.0a 12 100 i o = 250 to 750ma 5 50 quiescent current i q t j =+25 c 5.1 6.0 ma v i = 15v to 30v, t j =+25 c 0.5 quiescent current change d i q v i = 14v to 27v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.8 output voltage drift d v o / d t i o = 5ma -1.0 mv/ c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 14v to 24v 60 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 18 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o mv m v/v o t j =+25 c
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7815a/ra electrical characteristics (refer to the test circuits. t j = 0 to +150 c, i o =1a, v i =23v, c i = 0.33 m f, c o =0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 14.7 15 15.3 output voltage v o i o = 5ma to 1a, p d 15w v i = 17.7 to 30v 14.4 15 15.6 v v i = 17.9 to 30v i o = 500ma 10 150  line regulation d v o v i = 20 to 26v 5 150 mv v i = 17.5v to 30v 11 150 v i = 20v to 26v 3 75 t j =+25 c i o = 5ma to 1.5a 12 100 i o = 5ma to 1.0a 12 100 i o = 250 to 750ma 5 50 quiescent current i q t j =+25 c 5.2 6.0 ma v i = 17.5v to 30v, t j =+25 c 0.5 quiescent current change d i q v i = 17.5v to 30v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.8 output voltage drift d v o / d t i o = 5ma -1.0 mv/ c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 18.5v to 28.5v 58 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 19 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c m v/v o mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7818a/ra electrical characteristics (refer to the test circuits. t j = 0 to +150 c, i o =1a, v i = 27v, c i = 0.33 m f, c o = 0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 17.64 18 18.36 output voltage v o i o = 5ma to 1a, p d 15w v i = 21 to 33v 17.3 18 18.7 v v i = 21 to 33v i o = 500ma 15 180  line regulation d v o v i = 21 to 33v 5 180 mv v i = 20.6v to 33v 15 180 v i = 24v to 30v 5 90 t j =+25 c i o = 5ma to 1.5a 15 100 i o = 5ma to 1.0a 15 100 i o = 250 to 750ma 7 50 quiescent current i q t j =+25 c 5.2 6.0 ma v i = 21v to 33v, t j =+25 c 0.5 quiescent current change d i q v i = 21v to 33v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.8 output voltage drift d v o / d t i o = 5ma -1.0 mv/ c output noise voltage v n f = 10hz to 100khz t a =+25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 18.5v to 28.5v 57 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 19 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 c m v/v o mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) lm7824a/ra electrical characteristics (refer to the test circuits. t j = 0 to +150 c, i o =1a, v i = 33v, c i = 0.33 m f, c o =0.1 m f, unless otherwise specified) * load and line regulation are specified at constant, junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. characteristic symbol test conditions min typ max unit t j =+25 c 23.5 24 24.5 output voltage v o i o = 5ma to 1a, p d 15w v i = 27.3 to 38v 23 24 25 v v i = 27 to 38v i o = 500ma 18 240  line regulation d v o v i = 21 to 33v 6 240 mv v i = 26.7v to 38v 18 240 v i = 30v to 36v 6 120 t j =+25 c i o = 5ma to 1.5a 15 100 i o = 5ma to 1.0a 15 100 i o = 250 to 750ma 7 50 quiescent current i q t j =+25 c 5.2 6.0 ma v i = 27.3v to 38v, t j =+25 c 0.5 quiescent current change d i q v i = 27.3v to 38v, i o = 500ma 0.8 ma i o = 5ma to 1.0a 0.8 output voltage drift d v o / d t i o = 5ma -1.5 mv/ c output noise voltage v n f = 10hz to 100khz t a = 25 c 10 ripple rejection rr f = 120hz, i o = 500ma v i = 18.5v to 28.5v 54 db dropout voltage v d i o = 1a, t j =+25 c 2.0 v output resistance r o f = 1khz 20 m w short circuit current i sc v i = 35v, t a =+25 c 250 ma peak current i pk t j =+25 c 2.2 a  load regulation d v o t j =+25 o c m v/v o mv
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) typical performance characteristics fig. 1 quiescent current fig. 2 peak output current fig. 3 output voltage fig. 4 quiescent current
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) typical applications fig. 5 dc parameters fig. 6 load regulation fig. 7 ripple rejection typical applications (continued)
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) fig. 8 fixed output regulator fig. 9 constant current regulator notes : (1) to specify an output voltage. substitute voltage value for "xx." a common ground is required between the input and the output voltage. the input voltage must remain typically 2.0v above the output voltage even during the low point on the input ripple voltage. (2) c i is required if regulator is located an appreciable distance from power supply filter. (3) c o improves stability and transient response. fig. 10 circuit for increasing output voltage fig. 11 adjustable output regulator (7 to 30v) i ri 3 5 i q v o = v xx (1+r 2 /r 1 )+i q r 2
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) typical applications (continued) fig. 12 high current voltage regulator fig. 13 high output current with short circuit protection fig. 14 tracking voltage regulator fig. 15 split power supply ( 15v-1a)
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive) typical applications (continued) fig. 16 negative output voltage circuit fig. 17 switching regulator
lm78xx (ka78xx, mc78xx) fixed voltage regulator (positive)
trademarks acex? coolfet? crossvo l t? e 2 cmos tm f act? f act quiet series? f ast ? f as t r? g t o? hisec? the following are registered and unregistered trademarks fairchild semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. life support policy f airchilds products are not authorized for use as critical components in life suppo r t devices or systems without the express written appro v al of f airchild semiconduc t or corpor a tion. as used herein: isoplanar? microwire? pop? power t rench? qs? quiet series? supersot?-3 supersot?-6 supersot?-8 t inylogic? 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the bod y , or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the use r . 2. a critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to a f fect its safety or e f fectiveness. product s t a tus definitions definition of t erms datasheet identification product status definition advance information preliminary no identification needed obsolete this datasheet contains the design specifications for product development. specifications may change in any manner without notice. this datasheet contains preliminary data, and supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains final specifications. fairchild semiconductor reserves the right to make changes at any time without notice in order to improve design. this datasheet contains specifications on a product that has been discontinued by fairchild semiconducto r . the datasheet is printed for reference information onl y . formative or in design first production full production not in production disclaimer fairchild semiconductor reserves the right to make changes without further notice t o any products herein to improve reliabilit y , function or design. fairchild does not assume any liability arising out of the applic a tion or use of any product or circuit described herein; neither does it convey any license under its pa tent rights, nor the rights of others.


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